Practical surface analysis by auger and x ray photoelectron spectroscopy

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

practical surface analysis by auger and x ray photoelectron spectroscopy

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This is an updated manual covering the theory and practice of X-ray photoelectron spectroscopy XPS and Auger electron spectroscopy AES techniques for surface analysis. Topics covered include historical development; all relevant theory for data interpretation and a description of instrumentation; the major fields of applications, such as metallurgy, polymers, semiconductors, and corrosion science; catalysis; and many appendices of essential data for day-to-day use. This new edition also takes into account improvements in equipment, experimental procedures and data interpretation over the last seven years. Read more Read less. No customer reviews.

Briggs , M. Since the publication of the first edition, practical surface analysis has grown and diversified to such an extent that the editors have found it necessary to produce a new companion volume to cover the fields of ion and neutral spectroscopy. This first volume of the two-volume set discusses two closely related analytical techniques--Auger and X-ray photoelectron spectroscopy. Beginning with historical background of both AES and XPS, it provides in-depth examination of theory and practice of the two techniques. Information on instrumentation, spectral interpretation, depth profiling and quantification are also included. Volume II also discusses the treatment of ion and neutral techniques, but in a different manner because they have less in common than the electron spectroscopies. Both volumes have numerous appendices.

For these different techniques you can find different reference books. Here is a non-exhaustive list that you might complete. If you wish to complete this list please send the complete book references by email. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. All this new information is now integrated into a thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike. Edited by David Briggs and John T. Edit by : D.

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Practical surface analysis: by auger and x-ray photoelectron spectroscopy

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Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy XPS is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula , chemical state and electronic state of the elements that exist within a material. Put more simply, XPS is a useful measurement technique because it not only shows what elements are within a film but also what other elements they are bonded to. However at most the instrument will only probe 20nm into a sample. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed. XPS can be used to analyze the surface chemistry of a material in its as-received state, or after some treatment, for example: fracturing, cutting or scraping in air or UHV to expose the bulk chemistry, ion beam etching to clean off some or all of the surface contamination with mild ion etching or to intentionally expose deeper layers of the sample with more extensive ion etching in depth-profiling XPS, exposure to heat to study the changes due to heating, exposure to reactive gases or solutions, exposure to ion beam implant , exposure to ultraviolet light.

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ISBN 13: 9780471262794







  1. Chloe P. says:

    To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information.

  2. Anthony A. says:

    Practical Surface Analysis: Auger and X-ray photoelectron spectroscopy.

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  4. Harvey B. says:

    Table of contents

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